SID/ICDM 2024 Display

Metrology Short Course





SID/ICDM 2024 Display Metrology Short Course 

Sunday, May 12, 2024
9:00 am – 7:00 pm 

AM session: 9:00 am – 1:00 pm

PM session: 3:00 – 7:00 pm 

Room: 220B 



Scheduling Note: The timing of the metrology sessions makes it possible to combine a half-day session with a short course. An AM metrology session from 9:00 am to 1:00 pm, for example, allows you to attend an afternoon short course from 3:00 to 7:00 pm. 

The lunch break will feature product demonstrations from major metrology equipment manufacturers. 



Moderator: Tom Fiske, Intuitive Surgical


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Time: 9:00 – 9:45 am
















Time: 10:00 am – 12:00 pm 













Welcome and Introduction

General course overview includes logistics and a description of the International Committee for Display Metrology (ICDM) as well as a description of the Information Display Measurements Standard (IDMS).






Fundamentals of Display Metrology

Ferdinand Deger, Instrument Systems

Jens Jensen, Radiant Vision Systems


The significance of displays is evident in their ubiquity across technologies and industries and their footprint, growing to encompass entire device surfaces and fields of view. Display metrology provides an objective understanding of a display’s quality and performance through data, supplying tools for display innovation and evaluation to safeguard manufacturing investment.


This short course will provide a fundamental understanding of display metrology and introduce measurement equipment and techniques from leaders in the field. Topics include the science of light and color, units of measurement, measurement standards, metrology systems from spot meter spectroradiometers, to advanced imaging systems. The course will introduce test methods to address display performance parameters from mura to pixel uniformity. Metrology solutions for state-of-the-art testing applications are presented, ranging from curved displays to microLED panels and complete AR/VR devices. 




Ferdinand Deger joined Instrument Systems GmbH in 2017 and is currently head of the application engineering team. He is an experienced engineer in the field of light measurement and works on innovative solutions for µLED, AR/VR, display metrology, and VCSEL/IR measurements. Deger has a PhD in computer sScience from the Norwegian University of Science and Technology (NTNU) and the University of Burgundy, France, contributing to spectral imaging technology for cultural heritage applications. 



 Jens Jensen has spent decades working in the fields of photometric and colorimetric calibration and testing, developing precision solutions for light and color measurement, and is Radiant’s technical leader for 2D colorimeters and photometers. He is the author of 10 technical notes published by The Danish Illuminating Engineering Laboratory (LTL). He has published multiple peer-reviewed articles and reports, and presented at international conference sessions on topics such as FLCD, motion controllers for lighting systems, low luminance, contrast measurement, 2D measurement of dynamic and static luminance of color artifacts, and mura detection and measurement. 


Jensen is a member of the International Committee for Display Metrology (ICDM), and currently chairs the Uniformity sub-committee. He has also presented at SID’s Display Week Technical Symposium. He earned his master’s degree in mechanical engineering with a specialty in naval architecture at the Technical University of Denmark. Prior to joining Radiant, he worked at DELTA Light & Optics for 23 years, with roles as senior engineer and technical lead of the company’s DANAK-accredited photometric and colorimetric laboratory.



Time: 12:00 – 1:00 pm


Camera ILMD characteristics and Setup Constraints with a Focus on Display Metrology

Ingo Rotscholl. TechnoTeam Bildverarbeitung GmbH



The first part of this course introduces characteristic values for cameras/imaging luminance measurement devices (ILMDs) such as uniformity f22, linearity f31, aperture repeatability f28 and stray light characteristics f23, f24 and f25 according to CIE 244 as well as ISO12233. The course exemplarily demonstrates their impact on display measurement reproducibility for different applications, such as uniformity, sticking images, halo, or display MTF.


In the second part, attendees will learn about alignment topics for camera-based display metrology. This includes the limiting measurement field angle and different ways to correct this effect, including their advantages, disadvantages, and limitations. Furthermore, the course covers geometric alignment aspects and moiré. The latter includes the generation of high and low-frequency components and different moiré avoidance techniques and their applicability to different measurement tasks in display metrology.




Ingo Rotscholl obtained his PhD at the Light Technology Institute in Karlsruhe in 2017 and joined TechnoTeam Bildverarbeitung GmbH in 2018. There he is currently responsible for display metrology development and photometric robotics. He has filed 12 patents in this and related fields.


Rotscholl’s research focuses on camera-related display metrology such as uniformity, demura, sparkle, display MTF or sticking images for flat panels, microdisplays, and AR/VR/MR displays. In the past five years, he has presented over 28 display-metrology related conference papers and published four journal articles, including one best paper, one distinguished paper, and one special section paper. He has been a committee member at IMID since 2019 and for SID’s Display Week since 2022. Rotscholl is also an active expert in the ICDM and IEC TC 110. In 2023, he became an elected executive committee member of the ICDM as a member at large.




Time: 1:00  – 3:00 pm

Q&A, Equipment Demos, and Lunch





Time: 3:00 – 4:00 pm


Temporal Measurements

Michael Wilson, Westar Display Technologies



This course discusses the challenges of making temporal step-response measurements, especially as display response times have decreased. The instructor will look at recent changes in the IDMS related to fast displays and explore the basics of step-response measurements, sources of noise, filtering and the effect of temporal step response on motion blur.




Michael Wilson is a product manager at Westar Display Technologies, where he is responsible for the development of display measurement systems, light measurement devices, and display testing services.  He has been involved in the development and manufacture of temporal measurement systems for displays for over 20 years.  Prior to Westar, Wilson worked for McDonnell Douglas where he was principal investigator for the IR&D program to develop a vector calligraphic graphics processor for CRT HUDs, and vector-to-raster conversion and scaler electronics for LCDs.  He currently serves as the ICDM chair and ICDM subcommittee chair for temporal measurements. Wilson received his BS in electrical engineering from Rose-Hulman Institute of Technology, and a masters in electrical engineering from Washington University, St. Louis.






Time: 4:00 – 5:00 pm


Overview of NED Visual Performance Measurement Standards

John Penczek, Senior Research Associate, University of Colorado, Boulder



The purpose of the following NED sessions is to provide attendees with the knowledge to choose appropriate test methods that evaluate AR/VR near-eye display (NED) attributes that quantify visual performance and device characteristics related to perceived quality. This first session provides an overview of the published standard visual performance methods used to evaluate NEDs. The course begins by providing a survey of the major organizations developing NED standards and their place in the NED ecosystem. A detailed review is then given of the prominent IEC and IDMS NED standards that define measurements for visual performance metrics. The participants will obtain a better understanding of NED industry measurement best practices, in addition to important terminology and measurement concepts.




John Penczek is a senior research associate at the University of Colorado, Boulder, and guest researcher at the National Institute of Standards and Technology, Boulder, Colorado.  Dr. Penczek has been developing optical and electro-optic devices and systems for over 30 years, much of that time in the information display technology area. During that time, he was involved in product development at starts-ups, corporate research at large companies, and applied research at NIST and several universities. His more recent research involved display metrology development for 3D, transparent, and augmented/virtual-reality displays. Dr. Penczek is also a long-serving sub-committee chair in the ICDM, and a US expert on display metrology in IEC and ISO international standards.





Time: 5:00 – 6:00 pm

Geometric Considerations for Near-Eye Display Measurements 

Richard Austin, President & Chief Technology Officer of Gamma Scientific 



Near-eye display (NED) performance measurements in terms of field of view, eye box, luminance, color, resolution, distortion, and uniformity across the field of view are all dependent on the geometric positioning of the light measurement device (LMD) entrance pupil within the eye box. Understanding these dependencies is necessary to properly obtain repeatable and reproducible measurements of NED performance. The international standard geometric system for describing this entrance pupil position will be reviewed. In more detail, the two separate methods that the LMD entrance pupil may be positioned and moved within the eye box, pupil rotation and eye rotation, will be described and examples of different measurement results on the same NED will be presented.  Finally, the difference between the international standard spherical coordinate system for goniometric data collection and the perceptual coordinate system will be described.




Richard L. Austin is the president and chief technology officer of Gamma Scientific. He has more than 40 years of experience in the design and development of optical radiation measurement instrumentation. Austin is the inventor and co-inventor of seven patents, including two for near-eye display measurement apparatus and methods. His work has found use in a broad range of applications, including: head-up display and direct-view display characterization for the F-16, F-18 and C-17, F-117, and F-35 military aircraft and commercial displays; and quality assurance and process control for antireflection and other thin-film coatings, as well as LED, flash lamp, and lamp-based systems.  He served the ASTM E12 Color and Appearance Committee as a subcommittee working group chair, drafting standards for measurement methods and performance standards for retroreflective highway safety materials, and is also a member of CIE Division 2. He is currently serving as the ICDM subcommittee chair for VR/AR/HMD NED and as a subject matter expert on several IEC TC110 technical committees, responsible for the creation of display color, luminance, and resolution measurement standards. 








Time: 6:00 – 7:00 pm







NED Metrology Basics

Thomas Kerst, OptoFidelity




This course introduces the metrology of the NED eye box. It introduces the various ways it is commonly defined and measured and explains the advantages and disadvantages of each definition from an end-user point of view. The course introduces the relevant metrology for each definition and highlights its advantages and disadvantages when implementing it in a real factory setting. Finally, as a culmination of the eye box part of the course, the Draper method is introduced and explained in detail.


Further, various NED alignment methods are introduced, and their metrology explained. The course ends with the metrology of contrast and color uniformity (standard and non-standard) and their practical implementation.




Thomas Kerst is the chief metrology officer at the Finland-based optical metrology company OptoFidelity. He and his team deliver consistent and traceable optical metrology solutions to the AR/VR industry. The metrology team of OptoFidelity consistently pushes the standard of what is possible in the field of AR/VR metrology by introducing novelties such as a picometer-precise Littrow diffractometry for AR waveguides, one-in-all image quality testers, and temporal metrology for full headsets.


OptoFidelity works closely with the various national metrology institutes, universities, and academia to ensure that the AR/VR industry receives the best metrology possible and can thus deliver the highest-performing products.