2017 Program

   Special Topics

2017 SID/ICDM Introductory Display Metrology Training Course

1. Display metrology overview and review of fundamental areas. This includes session W-1 and W-2 in the morning (Radiometry, Photometry, and Colorimetry, as well as Display Metrology: Framework and Implementations). It also includes the bonus session on Reflection at the end of the course.

2. An overview of three categories of display measurement devices (LMDs, or Light Measurement Devices) followed by demonstrations of their use for a set of ICDM test patterns. The demonstrations will be during the lunch period (where lunch is provided) and after session W-6 at the end of the meeting.

3. The afternoon sessions vary entirely from the morning sessions. They are more of a technical introduction and metrology overview for new areas that do not yet have standards, and information as to how the standards will be developed for version 2 of the ICDM standard.

Morning Session
W-1 9:00 am - 9:50 am	Dr. Edward Kelley Consulting Physicist at KELTEK Research Longmont Colorado, USA	W-1: Radiometry, Photometry, and Colorimetry
The basics of light measurements starting with radiometry, then photometry, and finally colorimetry will be reviewed. The discussion will also be extended to include the difference between a 2D gamut and a 3D color volume
W-2 10:00 am – 10:50 am	Dr. Michael E. Becker Dr./PhD - Scientific Advisor Instrument Systems GmbH München - Germany	W-2: Display Metrology: Framework and Implementations
This seminar introduces the components of display metrology with focus on light measurement devices, test-patterns and generic characteristics of electronic display screens. A framework is presented that provides an overview of the basic target quantities for photometric and colorimetric analysis, systematic variations of physical parameters and the resulting dependencies, characteristics and graphical representations.
W-3 11:00 am – 12:00 pm	LMD categories (types) to be discussed and demonstrated -a- Spot Colorimeter / Photometer -b- Spectroradiometer -c- Imaging Colorimeter	W-3: LMD (Light Measurement Device) Measurement Method Comparisons
LMD Equipment Manufacturers: Konica Minolta Gooch & Housego Instrument Systems
Lunch & Demonstrations
Lunch 12:00 pm – 1:00pm	Demonstrations of the LMD categories making measurements from the ICDM display measurement standard conducted during the lunch break and after the last session. Lunch will be served to full-day attendees only.
Afternoon Session
W-4 1:00 pm – 2:15 pm	Tom Lianza	W-4: Heads Up and Near-Eye Display Measurement
The course will be focused on the challenges of measuring near-eye display systems. It will examine some typical optical designs and their respective challenges. There will be an overview of current activities with in the ICDM and other technical bodies. An overview of some current work in instrumentation will also be presented.
W-5 2:30 pm – 4:00 pm	Michael Smith	W-5: Introduction to HDR Video, HDR Content Mastering, HDR Distribution, and HDR Displays
Tutorial on HDR Video and how it differs from Legacy HD from the perspective of Content Mastering, Distribution and Display. Discussion of PQ EOTF and HDR Metrology.
W-6 4:10 pm – 5:00 pm	Prof. Karlheinz Blakenbach Pforzheim University, Display Lab Pforzheim, Germany	W-6: Automotive Display Measurements: Dedicated Challenges and Solutions
The requirements of automotive displays differ to a large extent from consumer and industrial displays. Examples are ambient light performance, lifetime (e.g., 8,000+h in 30 years), temperature range, static HMI content and LCD response time. These topics will be presented with best practice recommendations.
Bonus Session
Bonus 5:00 pm	• Ask the Experts • Demonstrations of the LMDs of each category making measurements from the ICDM display measurement standard.
Bonus	Dr. Edward Kelley Consulting Physicist at KELTEK Research Longmont Colorado, USA	Reflection Measurements for Displays
Canonical reflection terminology will be reviewed followed by a discussion about the most important reflection measurements to make and how to make them. A discussion of common errors that are made will be provided.