Michael Becker, Display-Metrology & Systems, Karlsruhe, Germany

Victor Belyaev, Moscow Region State University, Moscow, Russia

Yvan Bonnassieux, LPICM Ecole Polytechnique, Palaiseau, France

Thierry Borel, Technicolor, Cesson-Sévigné, France

Patrick Candry, Barco N.V., Kuurne, Belgium

Vladimir Chigrinov, Hong Kong University of Science & Technology, Kowloon, Hong Kong

Philippe Coni, THALES Avionics, Le Haillan, France

Sally Day, University College London, London, UK

Norbert Fruehauf, University of Stuttgart, Stuttgart, Germany

Ingrid Heynderickx, Eindhoven University of Technology, Eindhoven, The Netherlands

Ake Hornell, EuroLCDs SIA, Falun, Sweden

Jyrki Kimmel, Nokia Research Center, Tampere, Finland

Peter Knoll, University of Karlsruhe, Ettlingen, Germany

Igor Kompanets, Lebedev Physical Institute of RAS, Moscow, Russia

Tapani Levola, Microsoft, Espoo, Finland

Reiner Mauch, Schott AG, Mainz, Germany

Vassili Nazarenko, Ukrainian Academy of Sciences, Kiev, Ukraine

Gerrit Oversluizen, Philips Research Laboratories, Eindhoven, The Netherlands

Jutta Rasp, FPExperts, Munchen-Feldkirchen, Germany

Frank Rochow, Adviser, Berlin, Germany

Ian Sage, QinetiQ, Malvern, Worcs, UK

Marja Salmimaa, Nokia Research Center, Tampere, Finland

Martin Schadt, MS Hightech Consulting, Seltisberg, Switzerland

Aliaksandr Smirnov, Belarusian State University of Informatics & Radioelectronics, Minsk, Belarus

Ian Underwood, University of Edinburgh, Edinburgh, Scotland

Aron Vecht, Aron Vecht and Associates, London, UK

Sergei Yakovenko, Lenovo, Pleasanton, CA, USA